Pages are New and Unused, Front or Back cover is damaged- torn, wrinkled or dented., Used Like New, no missing pages, no damage to binding, may have a remainder mark.

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Dati bibliografici

Titolo: An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)
Editore: Oxford University Press
Rilegatura: hardcover
Condizione: LikeNew

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