Iris Analysis for Biometric Recognition Systems

Bodade, Rajesh M.; Talbar, Sanjay

ISBN 10: 8132218523 / ISBN 13: 9788132218524

Editore: Springer, India, Private Ltd, 2014

Series: SpringerBriefs in Applied Sciences and Technology/ SpringerBriefs in Computational Intelligence. Num Pages: 128 pages, 63 black & white illustrations, 19 black & white tables, biography. BIC Classification: TTBM; UYQ; UYQP. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 7. Weight in Grams: 213. . 2014. Paperback. . . . . Codice articolo V9788132218524

Riassunto:

The book presents three most significant areas in Biometrics and Pattern Recognition. A step-by-step approach for design and implementation of Dual Tree Complex Wavelet Transform (DTCWT) plus Rotated Complex Wavelet Filters (RCWF) is discussed in detail. In addition to the above, the book provides detailed analysis of iris images and two methods of iris segmentation. It also discusses simplified study of some subspace-based methods and distance measures for iris recognition backed by empirical studies and statistical success verifications.

Informazioni sull?autore:

Rajesh M. Bodade is currently working as Associate Professor in Faculty of Communication Engineering at Military College of Telecommunication Engineering, Mhow, Indore, India. He completed his PhD in Electronics and Telecommunication Engineering (Iris Analysis for Biometric Recognition System) from SRTM University, Nanded, India in 2011. Dr. Bodade has more than 20 years of teaching experience. He received “Chief of Army Staff Medal and Commendation” and “General Officer Command in Chief-Army Training Command Medal and Commendation” on 26 January 2011 and 15 August 2013, respectively, for his outstanding contribution in teaching and research at MCTE, Mhow. He has also published several papers/articles in National and International peer-reviewed journals and Conference Proceedings. He has published over 20 papers in refereed Journals and National/International Conferences of repute. He is the Life member of Indian Society for Technical Education, Institution of Engineers (India) and Fellow of IETE. His research interests include signal processing, pattern recognition, biometrics, SDR and cognitive radio.

Sanjay N. Talbar is a Professor in the Department of Electronics and Telecommunication Engineering, Shri Guru Gobind Singhji Institute of Engineering and Technology, Nanded, India. He received B.E. and M.E. degrees from SGGS Institute of Technology, Nanded, India in 1985 and 1990, respectively. He obtained his PhD from SRTM University, Nanded, India in 2000. He received the “Young Scientist Award” by URSI, Italy in 2003. He has published 10 books, 50+ papers in refereed Journals and more than 120 papers in National and International Conferences. He has guided about 70 students for dissertation at M.E./M.Tech. and supervised 10 students for PhD and additional research scholars are working towards their PhD. He is a member of various prestigious academic committees. He is a member of IET (UK), life member of Indian Society for Technical Education (ISTE) and Fellow of IETE. His research interests include image processing, multimedia computing, biometrics and embedded system design.

Dati bibliografici

Titolo: Iris Analysis for Biometric Recognition ...
Casa editrice: Springer, India, Private Ltd
Data di pubblicazione: 2014
Legatura: Brossura
Condizione: New