Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces

Sascha Sadewasser

ISBN 10: 3642271138 / ISBN 13: 9783642271137

Editore: Springer, Springer, 2013

Riguardo questo articolo

Druck auf Anfrage Neuware - Printed after ordering - Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Codice articolo 9783642271137

Dati bibliografici

• Titolo: Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
• Editore: Springer, Springer
• Data di pubblicazione: 2013
• Lingua: Inglese
• ISBN 10: 3642271138
• ISBN 13: 9783642271137
• Rilegatura: Taschenbuch
• Condizione: Neu
• Dimensioni: 235 L x 155 A x 19 P (millimetri) 235 millimetri di larghezza per 155 millimetri di altezza per 19 millimetri di profondità
• Peso: 528 grammi

Descrizione articolo

Riassunto

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Dalla quarta di copertina

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.