Machine Learning Methods for Reverse Engineering of Defective Structured Surfaces

Pascal Laube

ISBN 10: 3658290161 / ISBN 13: 9783658290160

Editore: Springer Fachmedien Wiesbaden Jan 2020, 2020

Riguardo questo articolo

This item is printed on demand - it takes 3-4 days longer - Neuware -Pascal Laube presents machine learning approaches for three key problems of reverse engineering of defective structured surfaces: parametrization of curves and surfaces, geometric primitive classification and inpainting of high-resolution textures. The proposed methods aim to improve the reconstruction quality while further automating the process. The contributions demonstrate that machine learning can be a viable part of the CAD reverse engineering pipeline. 180 pp. Englisch.

Codice articolo 9783658290160

Dati bibliografici

• Titolo: Machine Learning Methods for Reverse Engineering of Defective Structured Surfaces
• Editore: Springer Fachmedien Wiesbaden Jan 2020
• Data di pubblicazione: 2020
• Lingua: Inglese
• ISBN 10: 3658290161
• ISBN 13: 9783658290160
• Rilegatura: Taschenbuch
• Condizione: Neu
• Dimensioni: 210 L x 148 A x 11 P (millimetri) 210 millimetri di larghezza per 148 millimetri di altezza per 11 millimetri di profondità
• Peso: 241 grammi

Descrizione articolo

Riassunto

Pascal Laube presents machine learning approaches for three key problems of reverse engineering of defective structured surfaces: parametrization of curves and surfaces, geometric primitive classification and inpainting of high-resolution textures. The proposed methods aim to improve the reconstruction quality while further automating the process. The contributions demonstrate that machine learning can be a viable part of the CAD reverse engineering pipeline.

Informazioni sull?autore

Pascal Laube s main research interest is the development of machine learning methods for CAD reverse engineering. He is currently developing self-driving cars for an international operating German enterprise in the field of mobility, automotive and industrial technology.