How to Measure Anything: Finding the Value of Intangibles in Business

Hubbard, Douglas W.

ISBN 10: 0470539399 / ISBN 13: 9780470539392

Editore: John Wiley & Sons Inc, 2010

Very Good condition. Very Good dust jacket. 2nd edition. A copy that may have a few cosmetic defects. May also contain light spine creasing or a few markings such as an owner's name, short gifter's inscription or light stamp. Codice articolo U13B-05809

Riassunto:

Now updated with new research and even more intuitive explanations, a demystifying explanation of how managers can inform themselves to make less risky, more profitable business decisions This insightful and eloquent book will show you how to measure those things in your own business that, until now, you may have considered "immeasurable," including customer satisfaction, organizational flexibility, technology risk, and technology ROI. * Adds even more intuitive explanations of powerful measurement methods and shows how they can be applied to areas such as risk management and customer satisfaction * Continues to boldly assert that any perception of "immeasurability" is based on certain popular misconceptions about measurement and measurement methods * Shows the common reasoning for calling something immeasurable, and sets out to correct those ideas * Offers practical methods for measuring a variety of "intangibles" * Adds recent research, especially in regards to methods that seem like measurement, but are in fact a kind of "placebo effect" for management -- and explains how to tell effective methods from management mythology Written by recognized expert Douglas Hubbard-creator of Applied Information Economics-How to Measure Anything, Second Edition illustrates how the author has used his approach across various industries and how any problem, no matter how difficult, ill defined, or uncertain can lend itself to measurement using proven methods.

Informazioni sull?autore: DOUGLAS W. HUBBARD is the inventor of Applied Information Economics (AIE), a measurement methodology that has been used in IT portfolios, entertainment media, military logistics, R&D portfolios, and many more areas where big decisions are based on factors that seem difficult or impossible to measure. He is an internationally recognized expert in metrics, decision analysis, and risk management, and is a popular speaker at numerous conferences. He has written articles for InformationWeek, CIO Enterprise, Architecture Boston, Analytics and OR/MS Today and is also the author of The Failure of Risk Management: Why It's Broken and How to Fix It.

Dati bibliografici

Titolo: How to Measure Anything: Finding the Value ...
Casa editrice: John Wiley & Sons Inc
Data di pubblicazione: 2010
Legatura: Rilegato
Condizione: Very Good
Condizione sovraccoperta: sovraccoperta
Edizione: seconda edizione