Riassunto:
Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.
With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"
Dalla quarta di copertina:
Handbook of Microscopy Applications in Materials Science, Solid-State Physics and Chemistry Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How dose a given technique work?", and "Which technique is suitable for characterizing a given material?" From the Contents: Light Microscopy: Reflection Microscopy, Transmission Microscopy, Raman Microscopy, Three-dimensional Light Microscopy, Near Field Light Microscopy, Infrared Microscopy. X-ray Microscopy: Soft X-ray Imaging, X-ray Microradiography, X-ray Microtomography, X-ray Holographic Imaging, X-ray Topography. Acoustic Microscopy: Scanning Acoustic Microscopy, Photoacoustic Microscopy, Electron Acoustic Microscopy, Scanning Laser Acoustic Microscopy. Electron Microscopy: Stationary Beam Methods.
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
