Optimal Reliability Design Fundamentals and Applications

Kuo, Way, Prasad, V. Rajendra, Tillman, Frank A., & Hwang, Ching-Lai

ISBN 10: 0521781272 / ISBN 13: 9780521781275

Editore: Cambridge University Press, New York, NY, 2001

Riguardo questo articolo

389 pages. Former owner's name inked on inside front cover. Black marker mark on bottom edge of spine. Otherwise very good and clean conditition. ; 7 x 10 ''.

Codice articolo 69696

Dati bibliografici

• Titolo: Optimal Reliability Design Fundamentals and Applications
• Editore: Cambridge University Press, New York, NY
• Data di pubblicazione: 2001
• Lingua: Inglese
• ISBN 10: 0521781272
• ISBN 13: 9780521781275
• Rilegatura: Hardcover
• Condizione: Very Good+ with no dust jacket
• Cataloghi dei venditori:
  • Science, Physical Sciences, & Math

Descrizione articolo

Riassunto

This book, first published in 2000, is an introduction to modern systems reliability and reliability optimization, illustrated with real case studies.

Recensione

'The book is a very wide-ranging and thorough treatise on the solution of difficult problems in reliability optimization. A huge field of work is covered on many and varied problems for which it is often extremely difficult to find practical solutions. The writing is clear and careful and reflects the pooled expertise of the four authors. I would recommend this book for both learning and reference.' M. Crowder, International Statistical Institute

'... the book provides a detailed introduction to the fundamentals and applications of systems reliability and reliability optimisation ... I found the book excellent ... I highly recommend the book as a textbook for graduate courses in reliability engineering and operations research ... a valuable reference book for practising engineers and even for anyone seeking to know about reliability optimisation.' A. Saidane, Microelectronics Journal