*Price HAS BEEN REDUCED by 10% until Monday, May 5 (SALE ITEM)* 265 pp., hardcover, minor library markings else text clean & binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Codice articolo ZB1221441

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Titolo: Particle Characterization in Technology: ...

Casa editrice: Crc Pr I Llc

Data di pubblicazione: 1984

Legatura: Rilegato

Condizione: Very Good

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Riassunto:

Book by Beddow John Keith

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Zubal Books is the #1 buyer and seller of scholarly and rare books in America. Since 1961 we've handled thousands of private and technical libraries. Our family business knows books and we treat our clients with top-notch customer service. If you have any questions about our listings, please don't hesitate to contact us. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country

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Particle Characterization in Technology: Volume II: Morphological Analysis

John Keith Beddow, ed.

Usato - Rilegato

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