Photo-induced Defects in Semiconductors
Redfield, David; Bube, Richard H.
ISBN 10: 0521461960 ISBN 13: 9780521461962
Editore: Cambridge University Press, 1996
Usato
Hardcover
Da
ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.
Valutazione del venditore 5 su 5 stelle
Venditore AbeBooks dal 24 marzo 2009
Questo articolo specifico non è più disponibile.
Riguardo questo articolo
Descrizione:
Former library book; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less. Codice articolo G0521461960I4N10
Riassunto:
A thorough review of the properties of deep-level, localized defects in semiconductors.
Recensione: 'The authors give an excellent account of all the basic research undertaken in the area of defects in semiconductors particularly during the last 15 years. They assume that the reader has some basic knowledge of semiconductor physics. The text is presented in a very readable style and it contains over 100 figures. The book should be of direct interest to those scientists actively engaged in both fundamental and applied semiconductor physics. It is very readable and is of a high standard throughout.' C. A. Bates, Contemporary Physics
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
Dati bibliografici
Titolo: Photo-induced Defects in Semiconductors
Casa editrice: Cambridge University Press
Data di pubblicazione: 1996
Legatura: Hardcover
Condizione: Very Good
Condizione sovraccoperta: No Jacket