Probabilistic Theory of Pattern Recognition

Devroye, Luc; Gyorfi, Laszlo; Lugosi, Gabor

ISBN 10: 0387946187 / ISBN 13: 9780387946184

Editore: Springer, 1996

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Dati bibliografici

• Titolo: Probabilistic Theory of Pattern Recognition
• Editore: Springer
• Data di pubblicazione: 1996
• Lingua: Inglese
• ISBN 10: 0387946187
• ISBN 13: 9780387946184
• Rilegatura: Rilegato
• Condizione: As New

Descrizione articolo

Riassunto

Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.

Contenuti

Preface * Introduction * The Bayes Error * Inequalities and alternate distance measures * Linear discrimination * Nearest neighbor rules * Consistency * Slow rates of convergence Error estimation * The regular histogram rule * Kernel rules Consistency of the k-nearest neighbor rule * Vapnik-Chervonenkis theory * Combinatorial aspects of Vapnik-Chervonenkis theory * Lower bounds for empirical classifier selection * The maximum likelihood principle * Parametric classification * Generalized linear discrimination * Complexity regularization * Condensed and edited nearest neighbor rules * Tree classifiers * Data-dependent partitioning * Splitting the data * The resubstitution estimate * Deleted estimates of the error probability * Automatic kernel rules * Automatic nearest neighbor rules * Hypercubes and discrete spaces * Epsilon entropy and totally bounded sets * Uniform laws of large numbers * Neural networks * Other error estimates * Feature extraction * Appendix * Notation * References * Index