Recent Advances in Logo Detection Using Machine Learning Paradigms

Lingua: inglese

Editore: Springer International Publishing, Springer International Publishing Mai 2024, 2024

3031598105 / 9783031598104

Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

Venditore con 5 stelle

Venditore AbeBooks dal 11 gennaio 2012

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Descrizione dell’articolo da parte del venditore

This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents the current trends in deep learning-based object detection framework with a focus on logo detection tasks. It introduces a variety of approaches, including attention mechanisms and domain adaptation for logo detection, and describes recent advancement in object detection frameworks using deep learning. We offer solutions to the major problems such as the lack of training data and the domain-shift issues.This book provides numerous ways that deep learners can use for logo recognition, including:Deep learning-based end-to-end trainable architecture for logo detectionWeakly supervised logo recognition approach using attention mechanismsAnchor-free logo detection framework combining attention mechanisms to precisely locate logos in the real-world imagesUnsupervised logo detection that takes into account domain-shift issues from synthetic to real-world imagesApproach for logo detection modeling domain adaption task in the context of weakly supervised learning to overcome the lack of object-level annotation problem.The merit of our logo recognition technique is demonstrated using experiments, performance evaluation, and feature distribution analysis utilizing different deep learning frameworks.The book is directed to professors, researchers, practitioners in the field of engineering, computer science, and related fields as well as anyone interested in using deep learning techniques and applications in logo and various object detection tasks. 132 pp. Englisch.…

Codice articolo 9783031598104

Titolo
Recent Advances in Logo Detection Using Machine Learning Paradigms
Autore
Yen-Wei Chen
Editore
Springer International Publishing, Springer International Publishing Mai 2024
Anno di pubblicazione
2024
Condizione
Neu
Rilegatura
Buch
Lingua
inglese
ISBN 10
3031598105
ISBN 13
9783031598104
Peso dell'articolo
395 grammi
Dimensioni
241x160x13 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germania

Venditore con 5 stelle

Venditore AbeBooks dal 11 gennaio 2012

Tariffe di spedizione da Germania a U.S.A.

ArticoloDa 5 a 15 giorni lavorativiDa 5 a 15 giorni lavorativi
Primo articoloEUR 23,00EUR 23,00
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BuchWeltWeit Ludwig Meier e.K.

Germania

BuchWeltWeit Inh. Ludwig Meier e.K.
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51469 Bergisch Gladbach
Deutschland

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