SCANNING ELECTRON MICROSCOPE OPTICS .

Khursheed Anjam

ISBN 10: 9812836675 / ISBN 13: 9789812836670

Editore: World Scientific, 2010

SCANNING ELECTRON MICROSCOPE OPTICS . | Khursheed Anjam | Buch | Gebunden | Englisch | 2010 | World Scientific | EAN 9789812836670 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand. Codice articolo 101488416

Riassunto:

This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.

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Titolo: SCANNING ELECTRON MICROSCOPE OPTICS .
Casa editrice: World Scientific
Data di pubblicazione: 2010
Legatura: Buch
Condizione: Neu