Safety and Reliability Modeling and Its Applications combines work by leading researchers in engineering, statistics and mathematics who provide innovative methods and solutions for this fast-moving field. Safety and reliability analysis is one of the most multidimensional topics in engineering today. Its rapid development has created many opportunities and challenges for both industrialists and academics, while also completely changing the global design and systems engineering environment. As more modeling tasks can now be undertaken within a computer environment using simulation and virtual reality technologies, this book helps readers understand the number and variety of research studies focusing on this important topic.
The book addresses these important recent developments, presenting new theoretical issues that were not previously presented in the literature, along with solutions to important practical problems and case studies that illustrate how to apply the methodology.
Prof. Mangey Ram is Professor at Graphic Era (Deemed to be University), Dehradun, India. He is Editor-in-Chief of the International Journal of Mathematical, Engineering, and Management Sciences; Journal of Reliability and Statistical Studies; Journal of Graphic Era University; Series Editor of six book series with Elsevier, CRC Press-A Taylor and Frances Group, Walter De Gruyter Publisher Germany, River Publisher and Guest Editor and Associate Editor for various journals. His fields of research are reliability theory and applied mathematics.
He is Editor-in-Chief of the International Journal of Mathematical, Engineering, and Management Sciences; Journal of Reliability and Statistical Studies; Journal of Graphic Era University; Series Editor of six book series with Elsevier, CRC Press-A Taylor and Frances Group, Walter De Gruyter Publisher Germany, River Publisher and Guest Editor and Associate Editor for various journals.
His fields of research are reliability theory and applied mathematics.
Prof. Ram is a Senior Member of the IEEE, Senior Life Member of the Operational Research Society of India, the Society for Reliability Engineering, Quality and Operations Management in India, the Indian Society of Industrial and Applied Mathematics. He is a member of the organizing committee of several international and national conferences, seminars, and workshops. He was conferred the “Young Scientist Award” by the Uttarakhand State Council for Science and Technology, Dehradun, in 2009, and given the “Best Faculty Award” in 2011; “Research Excellence Award” in 2015; and “Outstanding Researcher Award” in 2018 for his significant contributions in academics and research at Graphic Era (deemed to be University), Dehradun, India. Most recently, he received the "Excellence in Research of the Year-2021 Award” from the Honourable Chief Minister of the Uttarakhand State, India.
Dr. Hoang Pham is a Distinguished Professor and former Chairman (2007-2013) of the Department of Industrial and Systems Engineering at Rutgers University, New Jersey. Before joining Rutgers, he was a Senior Engineering Specialist with the Idaho National Engineering Laboratory and Boeing Company. He received his Ph.D. in Industrial Engineering from the State University of New York at Buffalo. His research areas include reliability modeling of systems with competing risks and random environments, software reliability, and statistical inference.
He is the editor-in-chief of the International Journal of Reliability, Quality and Safety Engineering and an associate editor and editorial board member of several journals, and the editor of Springer Series in Reliability Engineering. His numerous awards include the 2009 IEEE Reliability Society Engineer of the Year Award. Dr. Pham is the author/coauthor of 7 books and has published over 190 journal articles, 100 conference papers, and edited 18 books including Springer Handbook in Engineering Statistics and Handbook in Reliability Engineering. He has delivered over 40 invited keynote and plenary speeches at many international conferences and institutions. He is a Fellow of the IEEE and IIE.
