Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy (Paperback)

Lingua: inglese

Editore: Springer Science+Business Media, Dordrecht, 1990

0306435918 / 9780306435911

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Venditore AbeBooks dal 22 giugno 2007

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Paperback. During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…

Codice articolo 9780306435911

Titolo
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy (Paperback)
Autore
Charles E. Lyman
Editore
Springer Science+Business Media, Dordrecht
Anno di pubblicazione
1990
Condizione
new
Rilegatura
Paperback
Lingua
inglese
ISBN 10
0306435918
ISBN 13
9780306435911

AussieBookSeller

Truganina, VIC, Australia

Venditore con 5 stelle

Venditore AbeBooks dal 22 giugno 2007

Tariffe di spedizione da Australia a U.S.A.

ArticoloDa 25 a 45 giorni lavorativiDa 8 a 14 giorni lavorativi
Primo articoloEUR 33,06EUR 39,31
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