Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric

ISBN 10: 0306441756 / ISBN 13: 9780306441752

Editore: Springer, 1992

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LIGHTNING FAST SHIPPING! A heavily used, but still working copy. Coffee stain and wrinkling to the edge of the pages when a tired undergrad fell asleep and knocked their cup over on their books. The binding and pages of the book have been reinforced with tape, has tape and stickers on the cover, as well as lots of notes (some of the answers in the learning activities may be filled in) on the pages. Definitely not pretty, but it's a working copy at a great price that ships fast. ~ Book does NOT contain an access code or CD/DVD.

Codice articolo #212F-00072

Dati bibliografici

• Titolo: Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
• Editore: Springer
• Data di pubblicazione: 1992
• Lingua: Inglese
• ISBN 10: 0306441756
• ISBN 13: 9780306441752
• Rilegatura: Rilegato
• Edizione: seconda edizione
• Condizione: Acceptable

Descrizione articolo

Riassunto

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop­ ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.

Recensione

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal