Scanning Probe Microscopy of Functional Materials | Nanoscale Imaging and Spectroscopy

Alexei Gruverman (u. a.)

ISBN 10: 144196567X / ISBN 13: 9781441965677

Editore: Springer New York, 2010

Scanning Probe Microscopy of Functional Materials | Nanoscale Imaging and Spectroscopy | Alexei Gruverman (u. a.) | Buch | xviii | Englisch | 2010 | Springer New York | EAN 9781441965677 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Codice articolo 101190042

Riassunto:

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Informazioni sull?autore: Sergei Kalinin is a researcher at Oak Ridge National Laboratory.Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.

Dati bibliografici

Titolo: Scanning Probe Microscopy of Functional ...
Casa editrice: Springer New York
Data di pubblicazione: 2010
Legatura: Buch
Condizione: Neu