Semiconductor Interfaces at the Sub-Nanometer Scale

Lingua: inglese

Editore: Springer Netherlands, Springer Netherlands Jul 1993, 1993

0792323971 / 9780792323976

Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

Venditore con 5 stelle

Venditore AbeBooks dal 11 gennaio 2012

Visualizza gli articoli di questo venditore
Rilegato

Condizione: Nuovo

EUR 213,99

EUR 23,00 spedizione 
Spedito da Germania a U.S.A.

Quantità: 2 disponibili

Aggiungi al carrello

Descrizione dell’articolo da parte del venditore

This item is printed on demand - it takes 3-4 days longer - Neuware -The Advanced Research Workshop on the Physical Properties of Semiconductor Interfaces at the Sub-Nanometer Scale was held from 31 August to 2 September, 1992, in Riva del Garda. Italy. The aim of the workshop was to bring together experts in different aspects of the study of semiconductor interfaces and in small-scale devices where the interface properties can be very significant It was our aim that this would help focus research of the growth and characterization of semiconductor interfaces at the atomic scale on the issues that will have the greatest impact on devices of the future. Some 30 participants from industrial and academic research institutes and from 11 countries contributed to the workshop with papers on their recent wode. . 'There was ample time for discussion after each talk. as well as a summary discussion at the end of the meeting. The major themes of the meeting are described below. The meeting included several talks relating to the different growth techniques used in heteroepitaxial growth of semiconductors. Horikoshi discussed the atomistic processes involved in MBE, MEE and MOCVD, presenting results of experimental RHEED and photoluminescence measurements; Foxon compared the merits of MBE, MOCVD, and eBE growth; Molder described RHEED studies of Si/Ge growth by GSMBE, and Pashley discussed the role of surface reconstructions in MBE growth as seen from STM studies on GaAs. On the theoretical side, Vvedensky described several different methods to model growth: molecular dynamics, Monte Carlo techniques, and analytic modeling. 272 pp. Englisch.

Codice articolo 9780792323976

Titolo
Semiconductor Interfaces at the Sub-Nanometer Scale
Autore
M. D. Pashley
Editore
Springer Netherlands, Springer Netherlands Jul 1993
Anno di pubblicazione
1993
Condizione
Neu
Rilegatura
Buch
Lingua
inglese
ISBN 10
0792323971
ISBN 13
9780792323976
Peso dell'articolo
576 grammi
Dimensioni
241x160x20 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germania

Venditore con 5 stelle

Venditore AbeBooks dal 11 gennaio 2012

Tariffe di spedizione da Germania a U.S.A.

ArticoloDa 5 a 15 giorni lavorativiDa 5 a 15 giorni lavorativi
Primo articoloEUR 23,00EUR 23,00
I tempi di consegna sono stabiliti dai venditori e variano in base al corriere e al paese. Gli ordini che devono attraversare una dogana possono subire ritardi e spetta agli acquirenti pagare eventuali tariffe o dazi associati. I venditori possono contattarti in merito ad addebiti aggiuntivi dovuti a eventuali maggiorazioni dei costi di spedizione dei tuoi articoli.

Metodi di pagamento

  • Visa
  • Mastercard
  • American Express
  • Carte Bleue
  • Apple Pay
  • Google Pay
  • Assegno
  • Bonifico bancario
  • PayPal

Informazioni sull’azienda del venditore

BuchWeltWeit Ludwig Meier e.K.

Germania