Semiconductor Material and Device Characterization. Questo articolo non è disponibile.
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Lingua: inglese
Editore: Wiley-Interscience, 1998
- Rilegato
- Usato
Da: Goodwill, Brooklyn Park, MN, U.S.A.Goodwill
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Venditore AbeBooks dal 26 giugno 2006
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Condizione: Usato - Buono
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Descrizione dell’articolo da parte del venditore
All pages and cover are intact including the dust cover, if applicable . Spine may show signs of wear. Pages may include limited notes and highlighting. May include "From the library of" labels. Shrink wrap, dust covers, or boxed set case may be missing. Item may be missing bundled media.
Codice articolo MINV.0471241393.G
- Titolo
- Semiconductor Material and Device Characterization
- Autore
- Schroder, Dieter K.
- Editore
- Wiley-Interscience
- Anno di pubblicazione
- 1998
- Condizione
- good
- Rilegatura
- Rilegato
- Lingua
- inglese
- ISBN 10
- 0471241393
- ISBN 13
- 9780471241393
- Edizione
- seconda edizione
Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques.
This newly revamped and expanded Second Edition incorporates the many innovations that have come to dominate the field during the past decade. From scanning probe techniques to the detection of metallic impurities in silicon wafers to the use of microwave reflection to measure contactless resistivity, each chapter presents state-of-the-art tools and techniques, most of which were in their infancy or had not yet been developed when the previous edition first came out. Featured here are:
* An entirely new chapter on reliability and probe microscopy
* Numerous examples and end-of-chapter problems - new to this edition
* Five hundred illustrations revised for this edition
* Updated bibliography with over 1,200 references
* Easy-to-use text including a real-world mix of units rather than strictly MKS units.
This practical new edition is ideal for textbook adoptions at the graduate level and is destined to become an essential reference for research and development teams in the semiconductor industry.
This newly revamped and expanded Second Edition incorporates the many innovations that have come to dominate the field during the past decade. From scanning probe techniques to the detection of metallic impurities in silicon wafers to the use of microwave reflection to measure contactless resistivity, each chapter presents state-of-the-art tools and techniques, most of which were in their infancy or had not yet been developed when the previous edition first came out. Featured here are:
* An entirely new chapter on reliability and probe microscopy
* Numerous examples and end-of-chapter problems - new to this edition
* Five hundred illustrations revised for this edition
* Updated bibliography with over 1,200 references
* Easy-to-use text including a real-world mix of units rather than strictly MKS units.
This practical new edition is ideal for textbook adoptions at the graduate level and is destined to become an essential reference for research and development teams in the semiconductor industry.
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Informazioni sull’autore
DIETER K. SCHRODER is Professor in the Department of Electrical Engineering at Arizona State University. A recipient of the ASU College of Engineering Teaching Excellence Award, he is author of Advanced MOS Devices.
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