Soft Error Mechanisms, Modeling and Mitigation

Selahattin Sayil

ISBN 10: 3319808486 / ISBN 13: 9783319808482

Editore: Springer, Berlin, Springer International Publishing, Springer, 2018

Riguardo questo articolo

Druck auf Anfrage Neuware - Printed after ordering - This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

Codice articolo 9783319808482

Dati bibliografici

• Titolo: Soft Error Mechanisms, Modeling and Mitigation
• Editore: Springer, Berlin, Springer International Publishing, Springer
• Data di pubblicazione: 2018
• Lingua: Inglese
• ISBN 10: 3319808486
• ISBN 13: 9783319808482
• Rilegatura: Taschenbuch
• Condizione: Neu
• Dimensioni: 235 L x 155 A x 6 P (millimetri) 235 millimetri di larghezza per 155 millimetri di altezza per 6 millimetri di profondità
• Peso: 197 grammi

Descrizione articolo

Riassunto

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.  

Informazioni sull?autore

Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University.  His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.