Written by a prominent statistician and author, the first edition of this bestseller broke new ground in the then emerging subject of spatial statistics with its coverage of spatial point patterns. Retaining all the material from the second edition and adding substantial new material, Statistical Analysis of Spatial and Spatio-Temporal Point Patterns, Third Edition presents models and statistical methods for analyzing spatially referenced point process data.

Reflected in the title, this third edition now covers spatio-temporal point patterns. It explores the methodological developments from the last decade along with diverse applications that use spatio-temporally indexed data. Practical examples illustrate how the methods are applied to analyze spatial data in the life sciences.

This edition also incorporates the use of R through several packages dedicated to the analysis of spatial point process data. Sample R code and data sets are available on the author’s website.

Recensione:

"... a valuable addition to the existing literature as it covers a number of topics in point pattern analysis, ranging from the basics of spatial point pattern statistical analysis to more recent developments in the spatio-temporal context. A number of examples are discussed throughout the chapters, which should facilitate the reading for practitioners of applied statistics from various disciplines. Besides this, the fact that data sets and R codes are available online certainly constitutes a nice addition to this application-oriented textbook."
―Mathematical Reviews, January 2015

"... well written, concise, and handy. ... there are remarkable changes in fundamentals [in this edition]. ... All concepts are well illustrated using interesting examples. ... an excellent introduction to point process statistics, in particular for beginners."
―Biometrical Journal, 2014

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Descrizione libreria

Hello! Ria Christie Collections is an online venture that was initially set up in 2012 to sell books. We do not have a physical high street store. We are professional online booksellers. We only sell brand new books in perfect condition that we source from various suppliers and the publishers. Primarily, our aim is to provide an excellent service to all our customers. We always work as a team to achieve this. Our other objectives are to: 1. Ensure that all our products reach their destination quickly in a safe and secure manner 2. Answer to all our customer queries within 24 hours 3. Ensure that our customers are happy with their purchases 4. Provide all the items at a competitive price 5. Always listen to our customers Ria Christie Collections is not a registered company. It is a Sole Trader venture. Other key information is shown below: Contact Person Name: Rakesh Luchmun (Mr) Storefront Name: Ria Christie Collections Place of Establishment Address: Suite B; ARUN House; ARUN Building Arundel Road Uxbridge UB8 2RR United Kingdom E-Mail Address: riachristie@hotmail.co.uk VAT Number: GB 160 5650 25 We always work hard and aim to comply with all of Abebooks Policies. If you have any issues, please do not hesitate to write to us whether before or after a purchase. We promise to reply to you promptly and, in any case, within 24 hours. Thank you kindly! Yours sincerely Mr Rakesh Luchmun (Founder) and the Ria Christie Collections Team

Visita la pagina della libreria

Informazioni sull?azienda del venditore

Ryefield Investments Limited
175 Pield Heath Road, Uxbridge, UB8 3NL, United Kingdom

Condizioni di vendita:

All Returns and Refund are as per Abebooks policies.

Condizioni di spedizione:

Orders usually ship within 2 business days. If your book order is heavy or oversized, we may contact you to let you know extra shipping is required. Thank you!

Metodi di pagamento
accettati dalla libreria

Aggiungi ai desiderata

Articoli correlati a Statistical Analysis of Spatial and Spatio-Temporal...

Statistical Analysis of Spatial and Spatio-Temporal Point Patterns (Chapman & Hall/CRC Monographs on Statistics and Applied Probability)

Diggle, Peter J.

Nuovi - Rilegato

Informazioni sull?azienda del venditore