Statistical Methods for SPC and TQM

Chatfield, Chris (Series edited by)/ Zidek, Jim (Series edited by)/ Lindsey, Jim (Series edited by)/ Bissell, D (Author)

ISBN 10: 0412394405 / ISBN 13: 9780412394409

Editore: Chapman & Hall, 1994

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384 pages. 9.50x6.50x0.75 inches. In Stock.

Codice articolo __0412394405

Dati bibliografici

• Titolo: Statistical Methods for SPC and TQM
• Editore: Chapman & Hall
• Data di pubblicazione: 1994
• Lingua: Inglese
• ISBN 10: 0412394405
• ISBN 13: 9780412394409
• Rilegatura: Hardcover
• Condizione: Brand New

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Riassunto

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices. Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered. Contents Data Collection and Graphical Summaries Numerical Data Summaries-Location and Dispersion Probability and Distribution Sampling, Estimation, and Confidence Sample Tests of Hypothesis; "Significance Tests" Control Charts for Process Management and Improvement Control Charts for Average and Variation Control Charts for "Single-Valued" Observations Control Charts for Attributes and Events Control Charts: Problems and Special Cases Cusum Methods Process Capability-Attributes, Events, and Normally Distributed Data Capability; Non-Normal Distributions Evaluating the Precision of a Measurement System (Gauge Capability) Getting More from Control Chart Data SPC in "Non-Product" Applications Appendices

Informazioni sull?autore

D Bissell