Statistical Regression with Measurement Error : Kendall's Library of Statistics 6

Chi-Lun Cheng

ISBN 10: 047071106X / ISBN 13: 9780470711064

Editore: Wiley Jun 2010, 2010

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Neuware - Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart 'Advanced Theory of Statistics' set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

Codice articolo 9780470711064

Dati bibliografici

• Titolo: Statistical Regression with Measurement Error : Kendall's Library of Statistics 6
• Editore: Wiley Jun 2010
• Data di pubblicazione: 2010
• Lingua: Inglese
• ISBN 10: 047071106X
• ISBN 13: 9780470711064
• Rilegatura: Buch
• Condizione: Neu
• Dimensioni: 240 L x 161 A x 20 P (millimetri) 240 millimetri di larghezza per 161 millimetri di altezza per 20 millimetri di profondità
• Peso: 592 grammi

Descrizione articolo

Riassunto

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

Informazioni sull?autore

Chi-Lun Cheng and John W. Van Ness are the authors of Statistical Regression with Measurement Error: Kendall's Library of Statistics 6, published by Wiley.