Surface Analysis The Principal Techniques 2e

Vickerman, John C. (Editor)/ Gilmore, Ian (Editor)

ISBN 10: 0470017635 / ISBN 13: 9780470017630

Editore: John Wiley & Sons Inc, 2009

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2nd edition. 688 pages. 10.00x7.00x1.75 inches. In Stock.

Codice articolo x-0470017635

Dati bibliografici

• Titolo: Surface Analysis The Principal Techniques 2e
• Editore: John Wiley & Sons Inc
• Data di pubblicazione: 2009
• Lingua: Inglese
• ISBN 10: 0470017635
• ISBN 13: 9780470017630
• Rilegatura: Hardcover
• Edizione: seconda edizione
• Condizione: Brand New
• Peso: 1,42 chilogrammi

Descrizione articolo

Riassunto

Die Theorie und Praxis der Oberflächenanalyse wird von Experten mehrerer Fachgebiete erläutert. Dadurch wird der Leser in die Lage versetzt, Ergebnisse und Datenreihen zu verstehen und umzusetzen.

Informazioni sull?autore

John C. Vickerman BSc in Chemistry (Edinburgh), Ph.D. in Surface Chemistry (Bristol), DSc (Bristol). Predoctoral fellowships at the Universities of Perugia and Rome, postdoctoral fellowships at the University of Bristol and the Technical University of Eindhoven. Sabbatical study periods at the University of Munich, the Free University of Berlin and Pennsylvania State University.

Dr Ian Gilmore, Surface and Nano-Analysis, National Physical Laboratory, Teddington, UK
Ian is a Principal Research Scientist in the Surface and Nano-Analysis Research team and joined NPL in 1991. His research has a focus on the analysis of complex molecules at surfaces. Recent research has led to the development of a novel new variant of static static SIMS called gentle-SIMS or G-SIMS,
He received a degree in Physics from the University of Manchester in 1991 and a PhD from the University of Loughborough in 2000. Ian is a Fellow of the Institute of Physics a member of the EPSRC College and a member of the American Vacuum Society.