Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

Sergei N. Magonov, et al.

ISBN 10: 3527293132 / ISBN 13: 9783527293131

Editore: Wiley-VCH Publishing, 1996

Very Good; Hardcover; Light wear to the covers; Unblemished textblock edges; Name on front endpaper, otherwise the endpapers and all text pages are clean and unmarked; The binding is excellent with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); White covers with title in black lettering; 1996, Wiley-VCH Publishing; 323 pages; "Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis," by Sergei N. Magonov, et al. Codice articolo SKU-003AS03708041

Riassunto:

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations.

Practical examples are taken from:

• inorganic layered materials
• organic conductors
• organic adsorbates at liquid-solid interfaces
• self-assembled amphiphiles
• polymers

This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.

Dalla quarta di copertina: Sergei N. Magonov, Myung-Hwan Whangbo Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to a lack of the proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical image analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip force induced surface corrugations. Practical examples are taken from:

• inorganic layered materials
• organic conductors
• organic adsorbates at liquid ? solid interfaces
• self-assembled amphiphiles
• polymers

This book will be an invaluable reference work for researchers active in STM and AFM as well as for newcomers to the field.

Dati bibliografici

Titolo: Surface Analysis with STM and AFM: ...
Casa editrice: Wiley-VCH Publishing
Data di pubblicazione: 1996
Legatura: Rilegato
Condizione: Very Good