Systematic Design of Analog IP Blocks

Gielen Georges Vandenbussche Jan Steyaert Michiel

ISBN 10: 1441953604 / ISBN 13: 9781441953605

Editore: Springer, 2012

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Print on Demand pp. 208 6:B&W 8.25 x 11 in or 280 x 210 mm Perfect Bound on White w/Gloss Lam.

Codice articolo 4286351

Dati bibliografici

• Titolo: Systematic Design of Analog IP Blocks
• Editore: Springer
• Data di pubblicazione: 2012
• Lingua: Inglese
• ISBN 10: 1441953604
• ISBN 13: 9781441953605
• Rilegatura: Brossura
• Condizione: New

Descrizione articolo

Riassunto

Systematic Design of Analog IP Blocks introduces a design methodology that can help to bridge the productivity gap. Two different types of designs, depending on the design challenge, have been identified: commodity IP and star IP. Each category requires a different approach to boost design productivity. Commodity IP blocks are well suited to be automated in an analog synthesis environment and provided as soft IP. The design knowledge is usually common knowledge, and reuse is high accounting for the setup time needed for the analog library. Star IP still changes as technology evolves and the design cost can only be reduced by following a systematic design approach supported by point tools to relieve the designer from error-prone, repetitive tasks, allowing him/her to focus on new ideas to push the limits of the design.
To validate the presented methodologies, three different industrial-strength applications have been selected and designed accordingly.

Recensione

From the reviews:

"This book addresses the problem of how to bridge efficiently the analog design productivity gap. ... The style of presentation is high, but clear. This valuable book is timely and well written. ... This book may be useful for graduate-level students in Electrical Engineering, as well as engineers and researchers who are familiar with mixed signal SoC design. ... I would like to certainly fully recommend this book to all SoC designers looking for a very up-to-date text of analog IP blocks." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)