Transmission Electron Microscopy and Diffractometry of Materials

Fultz, B., Howe, James M., Fultz, Brent

ISBN 10: 3540678417 / ISBN 13: 9783540678410

Editore: Springer Verlag, 2001

Riguardo questo articolo

Like New.

Codice articolo ERICA75735406784175

Dati bibliografici

• Titolo: Transmission Electron Microscopy and Diffractometry of Materials
• Editore: Springer Verlag
• Data di pubblicazione: 2001
• Lingua: Inglese
• ISBN 10: 3540678417
• ISBN 13: 9783540678410
• Rilegatura: Hardcover
• Condizione: Like New
• Tipo di libro: book

Descrizione articolo

Riassunto

This text covers the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and advanced-level material, using over 400 accompanying illustrations. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail.

Dalla quarta di copertina

This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD.