Unconventional Electron Microscopy for Molecular Structure Determination

R. Mason

ISBN 10: 3528081171 / ISBN 13: 9783528081171

Editore: Vieweg+Teubner Verlag, 1979

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Druck auf Anfrage Neuware - Printed after ordering - Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.

Codice articolo 9783528081171

Dati bibliografici

• Titolo: Unconventional Electron Microscopy for Molecular Structure Determination
• Editore: Vieweg+Teubner Verlag
• Data di pubblicazione: 1979
• Lingua: Tedesco
• ISBN 10: 3528081171
• ISBN 13: 9783528081171
• Rilegatura: Taschenbuch
• Condizione: Neu
• Dimensioni: 235 L x 155 A x 13 P (millimetri) 235 millimetri di larghezza per 155 millimetri di altezza per 13 millimetri di profondità
• Peso: 359 grammi

Descrizione articolo

Riassunto

Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto· meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe­ rent deflected scattered beams. This leads to the realization of an old dream in diffracto­ metry, namely to a general experimental solution of the "phase problem". The most im­ pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan­ ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on "Unconventional Electron Microscope Methods for the Investigation of Molecular Structures" (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell­ schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.

Contenuti

Instrumentation: Progress and Problems.- Progress in Scanning Transmission Electron Microscopy at the University of Chicago.- The Physics of Specimen Preparation.- Radiation Damage: Experimental Work.- Radiation Damage: The Theoretical Background.- The Electron Microscope, a Diffractometer to Measure Scattering Amplitudes and Phases.- Three-Dimensional Reconstruction of Aperiodic Objects in Electron Microscopy.- Three-Dimensional Low Dose Reconstruction of Periodical Aggregates.