VLSI Design and Test

Brajesh Kumar Kaushik

ISBN 10: 9811074690 / ISBN 13: 9789811074691

Editore: Springer Nature Singapore, Springer Nature Singapore Dez 2017, 2017

Riguardo questo articolo

Neuware -This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 840 pp. Englisch.

Codice articolo 9789811074691

Dati bibliografici

• Titolo: VLSI Design and Test
• Editore: Springer Nature Singapore, Springer Nature Singapore Dez 2017
• Data di pubblicazione: 2017
• Lingua: Inglese
• ISBN 10: 9811074690
• ISBN 13: 9789811074691
• Rilegatura: Taschenbuch
• Condizione: Neu
• Dimensioni: 235 L x 155 A x 45 P (millimetri) 235 millimetri di larghezza per 155 millimetri di altezza per 45 millimetri di profondità
• Peso: 1247 grammi

Descrizione articolo

Riassunto

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.