VLSI-SoC: Forward-Looking Trends in IC and Systems Design

Jose L. Ayala

ISBN 10: 3642285651 / ISBN 13: 9783642285653

Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2012, 2012

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Neuware -This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 368 pp. Englisch.

Codice articolo 9783642285653

Dati bibliografici

• Titolo: VLSI-SoC: Forward-Looking Trends in IC and Systems Design
• Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2012
• Data di pubblicazione: 2012
• Lingua: Inglese
• ISBN 10: 3642285651
• ISBN 13: 9783642285653
• Rilegatura: Buch
• Condizione: Neu
• Dimensioni: 241 L x 160 A x 25 P (millimetri) 241 millimetri di larghezza per 160 millimetri di altezza per 25 millimetri di profondità
• Peso: 717 grammi

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Riassunto

This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.