X84 Internationale Conference on X-Ray and Inner-Shell Processes in Atoms, Molecules and Solids - Leipzig 20.-24. August 1984, Conference Proceedings

sehr guter Zustand, geringe Gebrauchs- und Alterungsspuren: kleine Notiz auf dem Titel "These Proceedings contain the invited papers of the International Conference on X-ray and Inner-Shell Processes in Atoms, Molecules and Solids - X 84, held at the Karl-Marx- Universität in Leipzig, GDR, August 20 - 24, 1984. X 84 followed the International Conferences on X-ray Spectroscopy (essentially a biennial series, started 1965 in Ithaca and Leipzig, then in Kiev, Paris, Munich, Helsinki and Washington) and on Inner-Shell Ionization Phenomena (1972 Atlanta, 1976 Freiburg), which were subsequently combined into one series upon the suggestion of IUPAP (1978 Sendai, 1980 Stirling, 1982 Eugene). The Conference was organized by Sektion Chemie of Karl-Marx-Universität in cooperation with the Physikalische Gesellschaft and the Chemische Gesellschaft der DDR, represented by the Conference Committee and the organizing Committee. An InternationalAdvisory Board was acting as consultant (the Committees are listed below). The five-day Conference was attended by 346 participants from 28 countries and West Berlin, representing almost all developed socialist and capitalist countries and also some developing countries. The 8 plenary and the 40 key-note speakers were invited to publish their texts in the X 84 Proceedings, and most of them have used this opportunity. Also the prescribed limit of 10 pages was obeyed by most authors. The material has been reproduced directly from the camera-ready manuscripts as provi- ded by the authors. The texts are arranged as follows: first all plenary papers, then all key-note papers of the parallel sessions A, grouped according to the Conference programme (essentially ion-atom collisions and inner-shell ionization phenomena), and then in the same way the key-note papers of the parallel sessions B (essentially X-ray and electron spectroscopies). Moreover, 219 posters (contributed papers) wore presented during the Conference; two-page abstracts of these have been published in a separate X 84 Book of Abstracts. The interesting new results and the high quality of almost all Conference papers ." - Forward electron production in heavy ion-atom and ion-solid collisions I. A. Sellin - Solid State and Nuclear Atomic Effects in Inner-Shell Processes - Mechanisms of ion induced secondary electron emission from solid surfaces H. J. Frischkorn, P. Koschart J. Kemmler, R. Latz, D. Hofmann, 3. Schader, E. Rohrbach and K. O. Groeneveld - Gamma-ray internal conversion in basic and applied research O. Dragoun - Resonance Phenomena - Resonance effects in photoelectron spectra I. Linden - The effect of giant resonances on the emission spectra of rare earth elements T. M. Zimkina, A.S. Shulakov, V. A. Fomichev, A.P. Braiko and A. P. Stepanov - Inelastic X-ray scattering including resonance phenomena J. Tulkki - Chemical Effects in Inner-Shell Ionization - Fine structure and chemical shifts in particle induced X-ray emission spectroscopy M. A. Blokhin, S. M. Blokhin, A. A. Polyakov and S. A. Prosandeev - The influence of chemical surroundings on inneratomic properties E. Hartmann - Valence electron rearrangement prior to X-ray or Auger electron emission M. Uda, A. Koyana, K. Maeda and I. Sasa - Key-note Papers B - X-Ray Emission Spectroscopy - New results and developments in X-ray emission spectroscopy C. Bonnelle - X-ray spectroscopy and quantum-chemical investigation of electronic structure of molecules L. N. Mazalov - Polarized X-ray emission spectroscopy G. Dräger and O. Brümmer - X-ray emission spectra and ?structural aspects of disordered and amorphous materials G. Wiech and E. Z. Kurmaev - Electronic Structure Studies - d-s,p and f-p resonances in compounds and solid solutions E. P. Domashevskaya and V. A. Terekhov - Core electron spectroscopy of mixed valence materials O. K. Wertheim - Electronic structure spectroscopy of alloys and metallic hydrides D. J. Fabian - X-ray emission versus photoelectron spectra F. Werfel - X-Ray Abs.…