High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)

R. Dean Adams

ISBN 10: 1402072554 / ISBN 13: 9781402072550

Editore: Springer, 2002

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SIGNED BY AUTHOR. Springer-Verlag New York Inc., United States, 2002. Hardcover. Condition: New. 2003 ed. Language: English. Seller Inventory # 0000019. Codice articolo 0000020

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Titolo: High Performance Memory Testing: Design ...

Casa editrice: Springer

Data di pubblicazione: 2002

Legatura: Hardcover

Condizione: New

autografato: Signed by Author(s)

Descrizione articolo

Riassunto:

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Recensione:

From the reviews:

"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)