Kurt hingerl (18 risultati)

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  • Libri (18)

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  • Lingua: Inglese

    Editore: Springer, 2016

    3662519712 / 9783662519714

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    Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

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    EUR 333,33

    EUR 2,35 spedizione 
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    Condizione: New.

  • Lingua: Inglese

    Editore: Springer, 2013

    3642339557 / 9783642339554

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    Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

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    EUR 333,33

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    Lingua: Inglese

    Editore: Springer, 2016

    3662519712 / 9783662519714

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    Da: preigu, Osnabrück, Germaniapreigu

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    EUR 274,65

    EUR 70,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 5 disponibili

    Taschenbuch. Condizione: Neu. Ellipsometry at the Nanoscale | Maria Losurdo (u. a.) | Taschenbuch | xxiv | Englisch | 2016 | Springer | EAN 9783662519714 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

  • Lingua: Inglese

    Editore: Springer, 2016

    3662519712 / 9783662519714

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    EUR 348,59

    EUR 17,61 spedizione 
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    Quantità: Più di 20 disponibili

    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2013

    3642339557 / 9783642339554

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    EUR 348,59

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2016

    3662519712 / 9783662519714

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    Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

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    Condizione: Usato - Come nuovo

    EUR 371,86

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    Quantità: 15 disponibili

    Condizione: As New. Unread book in perfect condition.

  • Lingua: Inglese

    Editore: Springer, 2013

    3642339557 / 9783642339554

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    Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

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    Condizione: Usato - Come nuovo

    EUR 372,10

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    Quantità: 15 disponibili

    Condizione: As New. Unread book in perfect condition.

  • Lingua: Inglese

    Editore: Springer Vieweg, 2016

    3662519712 / 9783662519714

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    EUR 338,77

    EUR 42,87 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.…

  • Lingua: Inglese

    Editore: Springer Gabler, 2013

    3642339557 / 9783642339554

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    EUR 338,77

    EUR 44,00 spedizione 
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    Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.…

  • Lingua: Inglese

    Editore: Springer Verlag, 2013

    3642339557 / 9783642339554

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    EUR 472,45

    EUR 17,68 spedizione 
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    Quantità: 2 disponibili

    Hardcover. Condizione: Brand New. 2013 edition. 754 pages. French language. 9.25x6.25x1.75 inches. In Stock.

  • Lingua: Inglese

    Editore: Springer, 2013

    3642339557 / 9783642339554

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    Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condizione: Nuovo

    EUR 246,33

    EUR 11,00 spedizione 
    Spedito da Italia a U.S.A.

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    Condizione: new. Questo è un articolo print on demand.

  • Lingua: Inglese

    Editore: Springer, 2016

    3662519712 / 9783662519714

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    • Print on Demand

    Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    EUR 246,33

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    Condizione: new. Questo è un articolo print on demand.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2013

    3642339557 / 9783642339554

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    Da: moluna, Greven, Germaniamoluna

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    EUR 267,86

    EUR 48,99 spedizione 
    Spedito da Germania a U.S.A.

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides different aspects and opinion on a rapidly evolving fieldReviews recent applications of polarimetric techniques to nanomaterialsWritten by renomed experts in the fieldProvides different aspects and opinion on a rapidly e.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2016

    3662519712 / 9783662519714

    • Brossura
    • Print on Demand

    Da: moluna, Greven, Germaniamoluna

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    Condizione: Nuovo

    EUR 267,86

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides different aspects and opinion on a rapidly evolving fieldReviews recent applications of polarimetric techniques to nanomaterialsWritten by renomed experts in the fieldThis book presents and introduces ellipsometry in nanosc.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg Aug 2016, 2016

    3662519712 / 9783662519714

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 320,99

    EUR 23,00 spedizione 
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    Quantità: 2 disponibili

    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications. 756 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg Mrz 2013, 2013

    3642339557 / 9783642339554

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Condizione: Nuovo

    EUR 320,99

    EUR 23,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 2 disponibili

    Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications. 756 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Aug 2016, 2016

    3662519712 / 9783662519714

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Condizione: Nuovo

    EUR 320,99

    EUR 60,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 756 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2013, 2013

    3642339557 / 9783642339554

    • Rilegato
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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Condizione: Nuovo

    EUR 320,99

    EUR 60,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 756 pp. Englisch.…