Burkhard beckhoff (14 risultati)

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  • Lingua: Inglese

    Editore: Springer, 2006

    3540286039 / 9783540286035

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    EUR 756,03

    EUR 17,53 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2006

    3662496011 / 9783662496015

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    Condizione: Nuovo

    EUR 756,03

    EUR 17,53 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer Verlag, 2006

    3540286039 / 9783540286035

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    Condizione: Nuovo

    EUR 1066,49

    EUR 17,60 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: 2 disponibili

    Hardcover. Condizione: Brand New. 1st edition. 863 pages. 9.00x6.25x1.50 inches. In Stock.

  • Lingua: Inglese

    Editore: Springer, 2006

    3662496011 / 9783662496015

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    Da: California Books, Miami, FL, U.S.A.California Books

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    Condizione: Nuovo

    EUR 813,15

     Spedizione gratuita 
    Spedito in U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New.

  • Lingua: Inglese

    Editore: Springer, 2006

    3662496011 / 9783662496015

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Condizione: Nuovo

    EUR 788,28

    EUR 44,38 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.…

  • Lingua: Inglese

    Editore: Springer, 2006

    3540286039 / 9783540286035

    • Rilegato

    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Condizione: Nuovo

    EUR 788,28

    EUR 45,51 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.…

  • Condizione: Nuovo

    EUR 1064,85

    EUR 17,60 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: 2 disponibili

    Paperback. Condizione: Brand New. 2006 edition. 878 pages. 9.25x6.10x2.01 inches. In Stock.

  • Lingua: Inglese

    Editore: Springer, 2006

    3662496011 / 9783662496015

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    • Print on Demand

    Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condizione: Nuovo

    EUR 566,49

    EUR 11,00 spedizione 
    Spedito da Italia a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: new. Questo è un articolo print on demand.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3540286039 / 9783540286035

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Condizione: Nuovo

    EUR 748,99

    EUR 60,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3662496011 / 9783662496015

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    • Print on Demand

    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Condizione: Nuovo

    EUR 748,99

    EUR 60,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3662496011 / 9783662496015

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    • Print on Demand

    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Condizione: Nuovo

    EUR 748,99

    EUR 23,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 2 disponibili

    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students. 904 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3540286039 / 9783540286035

    • Rilegato
    • Print on Demand

    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

    Venditore con 5 stelle
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    Condizione: Nuovo

    EUR 748,99

    EUR 23,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 2 disponibili

    Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. 904 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2006

    3662496011 / 9783662496015

    • Brossura
    • Print on Demand

    Da: moluna, Greven, Germaniamoluna

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    Condizione: Nuovo

    EUR 619,04

    EUR 48,99 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest&nbspcore reference&nbspin this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2006

    3540286039 / 9783540286035

    • Rilegato
    • Print on Demand

    Da: moluna, Greven, Germaniamoluna

    Venditore con 5 stelle
    Contatta il venditore

    Condizione: Nuovo

    EUR 619,04

    EUR 48,99 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest&nbspcore reference&nbspin this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi.…