CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies
Pavlov, Andrei; Sachdev, Manoj
ISBN 10: 904817855X ISBN 13: 9789048178551
Editore: Springer, 2010
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Descrizione:
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Series: Frontiers in Electronic Testing. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305. . 2010. 1st ed. Softcover of orig. ed. 2008. Paperback. . . . . Codice articolo V9789048178551
Riassunto:
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
Informazioni sull?autore: Prof. Sachdev has authored several successful books with Springer
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Titolo: CMOS SRAM Circuit Design and Parametric Test...
Casa editrice: Springer
Data di pubblicazione: 2010
Legatura: Brossura
Condizione: New
Edizione: prima edizione
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Paperback)
Editore:
Springer, Dordrecht, 2010
ISBN 10: 904817855X
ISBN 13: 9789048178551
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Paperback
Prima edizione
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
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Paperback. Condizione: new. Paperback. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Codice articolo 9789048178551
Quantità: 1 disponibili
Foto dell'editore
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Paperback)
Editore:
Springer, Dordrecht, 2010
ISBN 10: 904817855X
ISBN 13: 9789048178551
Nuovo
Paperback
Prima edizione
Da: AussieBookSeller, Truganina, VIC, Australia
Valutazione del venditore 5 su 5 stelle
Paperback. Condizione: new. Paperback. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Codice articolo 9789048178551
Quantità: 1 disponibili