Fundamentals of Forensic DNA Typing

Butler, John M.

ISBN 10: 0123749999 / ISBN 13: 9780123749994

Editore: Academic Press, 2009

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Dati bibliografici

• Titolo: Fundamentals of Forensic DNA Typing
• Editore: Academic Press
• Data di pubblicazione: 2009
• Lingua: Inglese
• ISBN 10: 0123749999
• ISBN 13: 9780123749994
• Rilegatura: paperback
• Edizione: 1st Edition.
• Condizione: New

Descrizione articolo

Riassunto

John Butler, bestselling author of Forensic DNA Typing, now applies his expertise on the subject of DNA analysis into an introductory textbook. Fundamentals of Forensic DNA Typing walks students step-by-step through the DNA analysis process beginning with collection of evidence at a crime scene to the statistical interpretation of the results. Also included are brief discussions of such news worthy topics as victim identification from the September 11, 2001 attacks, the identification of the remains of the Romanovs, the last Russian Royal family, and the O.J. Simpson case. New applications, such as genetic genealogy and tracing domestic pet hairs to perpetrators, are also detailed. With its clear and understandable style and extensive list of online ancillaries and study aids, this textbook will make the subject accessible to students in forensic science courses worldwide.

Informazioni sull?autore

John M. Butler is a NIST Fellow and Special Assistant to the Director for Forensic Science, Office of Special Programs, at the U.S. National Institute of Standards and Technology, in Gaithersburg, Maryland. Dr. Butler earned his PhD from the University of Virginia while doing DNA research in the FBI Laboratory's Forensic Science Research Unit. He has won numerous scientific awards, including being named Science Watch’s #1 world-wide high-impact author in legal medicine and forensic science over the last decade (July 2011). He has over 150 publications in this field and is a frequent presenter on the topic of DNA typing, and has authored four other DNA Typing books including Advanced Topics in Forensic DNA Typing: Methodology. For a detailed CV, visit http://www.cstl.nist.gov/strbase/butler.htm.