ORIGINAL, NOT A REPRINT OR PHOTOCOPY!! NO Dust Jacket. Has or May Have all standard Library markings, pocket, labels, stamps, wear and soil to covers. CLEAN TEXT! See Picture! The Copyright date is 1993 for this Printing. This volume was purchased through DMRO from the Wright-Patterson Technical Library in the late 1990's. Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!! SEE PICTURES!!!!! ANY ODD/GREEN TONES ON THE SCANS ARE CAUSED BY MY SCANNER!! All of our Technical/Textbook/Ex-Library volumes were obtained legally through Public or Auction sales. This volume was purchased through Local Public Auction. All of our Technical/Textbook/Ex-Library volumes were obtained legally through Public or Auction sales. This volume was purchased through DMRO from the Wright-Patterson Technical Library in the late 1990's. Size: 4to.

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Dati bibliografici

Titolo

Integrated Circuit Metrology, Inspection, and Process Control VII: Proceedings of SPIE, Volume 1926, 2-4 March 1993, San Jose, California

Editore

SPIE PRESS-The International Society for Optical Engineering, Bellingham, WA, U.S.A.

Data di pubblicazione

1993

Lingua

Inglese

ISBN 10

0819411604

ISBN 13

9780819411600

Rilegatura

Paperback

Edizione

1st.

Condizione

Very Good

Condizione della sovraccoperta

No Jacket

Tipo di libro

Ex-Library

Cataloghi dei venditori

Descrizione libreria

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SUNSET BOOKS 2
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