Practical Guide for the Preparation of Specimens for X-ray Flourescence and X-ray Diffraction Analysis

Buhrke

ISBN 10: 0471194581 / ISBN 13: 9780471194583

Editore: John Wiley and Sons Ltd, 1997

Riguardo questo articolo

X-ray fluorescence (XRF) and x-ray diffraction (XRD) are analytical techniques used to identify substances by examining the amount of energy given off from a substance during an x-ray. The most common errors in XRF analysis and XRD usually occur during preparation of the specimen. Editor(s): Buhrke, Victor E.; Jenkins, Ron; Smith, Deane K. Num Pages: 360 pages, bibliography. BIC Classification: MQH; PNFS. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 243 x 223 x 25. Weight in Grams: 702. . 1997. 1st Edition. Hardcover. . . . .

Codice articolo V9780471194583

Dati bibliografici

• Titolo: Practical Guide for the Preparation of Specimens for X-ray Flourescence and X-ray Diffraction Analysis
• Editore: John Wiley and Sons Ltd
• Data di pubblicazione: 1997
• Lingua: Inglese
• ISBN 10: 0471194581
• ISBN 13: 9780471194583
• Rilegatura: Rilegato
• Edizione: prima edizione
• Condizione: New

Descrizione articolo

Riassunto

Das erste Buch, das die leistungsstarken Analyseinstrumente der Röntgendiffraktion und Röntgen-Fluoreszenzspektrometrie sowie auch das Präparieren von Analyseproben behandelt. Jedes Kapitel liefert detaillierte Informationen, Schritt-für-Schritt-Anleitungen und Anregungen, wo man die notwendige Ausrüstung für Probenpräparationen, Standards und Analysen findet. (10/97)

Informazioni sull?autore

VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California.

RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.

DEANE K. SMITH is a professor emeritus in the Department of Geosciences at Pennsylvania State University.