A fine copy in pictorial boards issued w/o a DJ. 1st edition with complete number line. Illustrated; Contents: Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References. 8vo., 213 pages.

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Titolo

Principles of Semiconductor Network Testing (Test & Measurement)

Editore

Boston, MA: U.S.A.: Newnes / Butterworth Heinemann

Data di pubblicazione

1995

Lingua

Inglese

ISBN 10

0750694726

ISBN 13

9780750694728

Rilegatura

Hardcover

Edizione

1st Edition

Condizione

Fine

Condizione della sovraccoperta

No Jacket

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Descrizione articolo

Riassunto

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Introduces a novel component-testing philosophy for semiconductor test, product and design engineers.
Best new source of information for experienced semiconductor engineers as well as entry-level personnel.
Eight chapters about semiconductor testing.

Product Description

Book by Afshar Amir

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