Statistical Regression with Measurement Error: Kendall?s Library of Statistics 6

Chi-Lun Cheng

ISBN 10: 047071106X / ISBN 13: 9780470711064

Editore: John Wiley & Sons Inc, 1999

Riguardo questo articolo

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. Num Pages: 262 pages, black & white illustrations. BIC Classification: PB. Category: (P) Professional & Vocational. Dimension: 236 x 166 x 23. Weight in Grams: 554. . 2010. 1st Edition. Hardcover. . . . .

Codice articolo V9780470711064

Dati bibliografici

• Titolo: Statistical Regression with Measurement Error: Kendall?s Library of Statistics 6
• Editore: John Wiley & Sons Inc
• Data di pubblicazione: 1999
• Lingua: Inglese
• ISBN 10: 047071106X
• ISBN 13: 9780470711064
• Rilegatura: Rilegato
• Edizione: prima edizione
• Condizione: New

Descrizione articolo

Riassunto

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

Informazioni sull?autore

Chi-Lun Cheng and John W. Van Ness are the authors of Statistical Regression with Measurement Error: Kendall's Library of Statistics 6, published by Wiley.