Importo totale (1 articolo articoli):
Destinazione ordine:
browning pennycook (38 risultati)
Vai alla pagina principale dei risultati di ricerca
Filtri di ricerca
Tipo di articolo
- Tutti i tipi di prodotto
- Libri (38)
- Riviste e Giornali (Nessun altro risultato corrispondente a questo perfezionamento)
- Fumetti (Nessun altro risultato corrispondente a questo perfezionamento)
- Spartiti (Nessun altro risultato corrispondente a questo perfezionamento)
- Arte, Stampe e Poster (Nessun altro risultato corrispondente a questo perfezionamento)
- Fotografie (Nessun altro risultato corrispondente a questo perfezionamento)
- Mappe (Nessun altro risultato corrispondente a questo perfezionamento)
- Manoscritti e Collezionismo cartaceo (Nessun altro risultato corrispondente a questo perfezionamento)
Condizioni Maggiori informazioni
- Nuovo (32)
- Come nuovo, Ottimo o Quasi ottimo (4)
- Molto buono o Buono (2)
- Discreto o Mediocre (Nessun altro risultato corrispondente a questo perfezionamento)
- Come descritto (Nessun altro risultato corrispondente a questo perfezionamento)
Legatura
Ulteriori caratteristiche
- Prima ed. (Nessun altro risultato corrispondente a questo perfezionamento)
- Copia autograf. (Nessun altro risultato corrispondente a questo perfezionamento)
- Sovracoperta (Nessun altro risultato corrispondente a questo perfezionamento)
- Con foto (10)
- Non Print on Demand (25)
Lingua (1)
Spedizione gratuita
Paese del venditore
Valutazione venditore
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
EUR 4,11
Spedizione EUR 15,59
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1200grams, ISBN:9780521554909.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 55,37
Spedizione EUR 2,27
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Characterization of High Tc Materials and Devices by Electron Microscopy (Paperback or Softback)
Lingua: Inglese
Editore: Cambridge University Press 11/23/2006, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: BargainBookStores, Grand Rapids, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Paperback or Softback. Condizione: New. Characterization of High Tc Materials and Devices by Electron Microscopy. Book.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: California Books, Miami, FL, U.S.A.
Valutazione del venditore 4 su 5 stelle
EUR 59,42
Spedizione gratuita
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 61,50
Spedizione EUR 2,27
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 58,33
Spedizione EUR 13,73
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press 2006-11-23, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: Chiron Media, Wallingford, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 55,34
Spedizione EUR 17,75
Spedito da Regno Unito a U.S.A.Quantità: 10 disponibili
Aggiungi al carrelloPaperback. Condizione: New.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 58,26
Spedizione EUR 17,19
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Valutazione del venditore 5 su 5 stelle
EUR 68,85
Spedizione EUR 10,50
Spedito da Irlanda a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . .
-
Characterization Of High Tc Materials And Devices By Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Da: Basi6 International, Irving, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
-
Characterization Of High Tc Materials And Devices By Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 64,67
Spedizione EUR 17,19
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
-
CHARACTERIZATION OF HIGH TC MATERIALS AND DEVICES BY ELECTRON MICROSCOPY
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Da: Basi6 International, Irving, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
-
Characterization Of High Tc Materials And Devices By Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: Kennys Bookstore, Olney, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 84,49
Spedizione EUR 9,04
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . . Books ship from the US and Ireland.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2015
ISBN 10: 052155490X ISBN 13: 9780521554909
EUR 29,90
Spedizione EUR 105,00
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Sehr gut. Zustand: Sehr gut | Seiten: 406 | Sprache: Englisch | Produktart: Bücher | A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
EUR 77,84
Spedizione EUR 63,51
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of new superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunneling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is also discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This book will interest graduate students and researchers in condensed matter physics and material science.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 167,48
Spedizione EUR 13,73
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Da: California Books, Miami, FL, U.S.A.
Valutazione del venditore 4 su 5 stelle
EUR 188,02
Spedizione gratuita
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Valutazione del venditore 5 su 5 stelle
EUR 193,25
Spedizione EUR 10,50
Spedito da Irlanda a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen J. Num Pages: 406 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 1125. . 2000. Illustrated. hardcover. . . . .
-
Edizione InternazionaleCharacterization Of High Tc Materials And Devices By Electron Microscopy
Da: UK BOOKS STORE, London, LONDO, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 204,34
Spedizione EUR 6,86
Spedito da Regno Unito a U.S.A.Quantità: 3 disponibili
Aggiungi al carrelloHardcover. Condizione: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 200,66
Spedizione EUR 28,65
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. Like New. book.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Da: Kennys Bookstore, Olney, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 242,77
Spedizione EUR 9,04
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen J. Num Pages: 406 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 1125. . 2000. Illustrated. hardcover. . . . . Books ship from the US and Ireland.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
EUR 223,93
Spedizione EUR 64,39
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
-
Characterization of High Tc Materials and Devices by Electron Microscopy (Paperback)
Lingua: Inglese
Editore: Cambridge University Press, Cambridge, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
Paperback. Condizione: new. Paperback. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 60,02
Spedizione EUR 14,33
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 406 pages. 9.30x6.70x1.00 inches. In Stock. This item is printed on demand.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 63,10
Spedizione EUR 20,11
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloPaperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
-
Characterization of High Tc Materials and Devices by Electron Microscopy (Paperback)
Lingua: Inglese
Editore: Cambridge University Press, Cambridge, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Da: CitiRetail, Stevenage, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 64,31
Spedizione EUR 42,40
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: new. Paperback. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Lingua: Inglese
Editore: Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
EUR 62,80
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning .
