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RF and microwave nonlinear device characterization. modeling and theoretical basis of design parameters X(Chinese Edition)
[ MEI ] D.E. LU TE . [ MEI ] J. WEI SI PAI QIE TE DENG ZHU
712127602X / 9787121276026
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Da: liu xing, Nanjing, JS, Cinaliu xing
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Condizione: Nuovo
EUR 80,27
EUR 16,05 spedizione
Spedito da Cina a U.S.A.
Quantità: 5 disponibili
paperback. Condizione: New. Paperback. Pub Date: 2016-01-01 Pages: 216 Language: Chinese Publisher: Electronic Industry Press book Deep systematically introduces the concepts and principles of nonlinear static and dynamic X parameters and their measurement. modeling design and application examples. The book has six chapters. Chapter 1 linear S parameter theory made a brief review; 2.3.4 chapter describes the system in large excitation signal tone. the physical meaning of the basic theory of static nonlinear X-parameter . …