J sivaraman (43 risultati)
Altre immaginiFarmers of Indian (Volume 2): Madras, Andhra, Pradesh, Mysore, & Kerala
Randhawa, M. S., M. S. Sivaraman, I. J. Naidu, Suresh Vaidya
Lingua: Inglese
Editore: Indian Council of Agricultural Research, New Dehli, 1961
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- Prima edizione
Da: Paradox Books USA, Fort Collins, CO, U.S.A.Paradox Books USA
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Molto buono
EUR 27,69
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibile
Aggiungi al carrelloHardcover. Condizione: Very Good. Condizione sovraccoperta: Good. 1st Edition. Hardcover with dust jacket; full green cloth over boards with gold lettering stamped on spine. Green matte DJ. Sewn binding. 426 pages, with dozens of b/w photographs and many maps; glossary, appendices, bibliography, index. Stated 1st Edition, 1st Printing. CONDITION: Book NEAR FINE, binding square and tight, pages unmarked, no names; foxing on end papers; DJ GOOD, wrappers rubbed and creased, quarter-sized chips at head and foot of spine and lower back corner. corner chips, 3-inch closed tear at base of spine; not clipped, protected in a clear archival (Mylar) cover. CONTENT: Description of farmers and farming conditions in select regions of India, adding to the areas covered in Volume 1. >Guaranteed prompt shipment, secure packaging, and free tracking. …
Editore: Indian Council of Agricultural Research
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Da: The Book Garden, Bountiful, UT, U.S.A.The Book Garden
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EUR 17,54
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Aggiungi al carrelloHardcover. Condizione: Good - Cash. No Jacket. General use wear, surface and edges rubbed. Corners bumped and show wear. Pages show reader wear. P/o stamp inside. Foxing/yellowing to the end pages. Stock photos may not look exactly like the book.

Lingua: Inglese
Editore: Kluwer Academic Publishers, Dordrecht, Holland, 1997
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- Prima edizione
Da: PsychoBabel & Skoob Books, Didcot, Regno UnitoPsychoBabel & Skoob Books
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EUR 33,06
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hardcover. Condizione: Very Good. No Dust Jacket. First Edition. Hardback in very good condition. Printed boards, a little scuffed; previous owner's name on FEP, no jacket as issued; contents clean, sound, bright. TPW. Used.

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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 58,09
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Hardcover. Condizione: Like New. Like NewLIKE NEW. book.

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EUR 117,79
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Condizione: New.

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Da: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
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hardcover. Condizione: New. In shrink wrap. Looks like an interesting title.

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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 127,33
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Condizione: As New. Unread book in perfect condition.

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Da: Buchpark, Trebbin, GermaniaBuchpark
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EUR 35,62
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Condizione: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

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Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 132,60
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Condizione: New. This text applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. Num Pages: 155 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 11. Weight in Grams: 426. . 1997. Hardback. . . . .…

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EUR 131,82
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Condizione: New.

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Condizione: New. Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in .

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Condizione: New. pp. 176.

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Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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Condizione: New. This text applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. Num Pages: 155 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 11. Weight in Grams: 426. . 1997. Hardback. . . . . Books ship from the US and Ireland.…

Practical Aspects of Industrial Welding Processes
Sivaraman, Krishnan (EDT); Krishnan, J. (EDT); Badheka, Vishvesh J. (EDT)
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Condizione: As New. Unread book in perfect condition.

Practical Aspects of Industrial Welding Processes
Sivaraman, Krishnan (EDT); Krishnan, J. (EDT); Badheka, Vishvesh J. (EDT)
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Da: California Books, Miami, FL, U.S.A.California Books
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Condizione: New.

- Brossura
Da: Buchpark, Trebbin, GermaniaBuchpark
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Condizione: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

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Practical Aspects of Industrial Welding Processes
Sivaraman, Krishnan (EDT); Krishnan, J. (EDT); Badheka, Vishvesh J. (EDT)
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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Practical Aspects of Industrial Welding Processes
Sivaraman, Krishnan (EDT); Krishnan, J. (EDT); Badheka, Vishvesh J. (EDT)
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Advances in Artificial Intelligence : Biomedical Engineering Applications in Signals and Imaging
Pal, Kunal (EDT); Neelapu, Bala Chakravarthy (EDT); Sivaraman, J. (EDT)
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Advances in Artificial Intelligence : Biomedical Engineering Applications in Signals and Imaging
Pal, Kunal (EDT); Neelapu, Bala Chakravarthy (EDT); Sivaraman, J. (EDT)
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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EUR 252,39
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Practical Aspects of Industrial Welding Processes
Sivaraman, Krishnan (Editor)/ Krishnan, J. (Editor)/ Badheka, Vishvesh J. (Editor)
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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Hardcover. Condizione: Brand New. 288 pages. 9.18x6.12x9.45 inches. In Stock.

Advances in Artificial Intelligence : Biomedical Engineering Applications in Signals and Imaging
Pal, Kunal (EDT); Neelapu, Bala Chakravarthy (EDT); Sivaraman, J. (EDT)
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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EUR 272,64
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Condizione: New.

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Da: moluna, Greven, Germaniamoluna
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Condizione: New. Covers the recent advancements of artificial intelligence in healthcare, including case studies on how this technology can be usedProvides an understanding of the design of experiments to validate the developed algorithmsPresents a.