Editore: Kluwer Academic Publishers, 2002
ISBN 10: 1402071191 ISBN 13: 9781402071195
Lingua: Inglese
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 134,68
Convertire valutaQuantità: 15 disponibili
Aggiungi al carrelloCondizione: New. Talks about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. This book aims to position test resource partitioning in the context of SOC test automation. It presents various techniques for the partitioning and optimization of the three major SOC test resources. Series: Frontiers in Electronic Testing. Num Pages: 244 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 15. Weight in Grams: 1170. . 2002. Hardback. . . . .
Editore: Kluwer Academic Publishers, 2002
ISBN 10: 1402071191 ISBN 13: 9781402071195
Lingua: Inglese
Da: Kennys Bookstore, Olney, MD, U.S.A.
EUR 167,25
Convertire valutaQuantità: 15 disponibili
Aggiungi al carrelloCondizione: New. Talks about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. This book aims to position test resource partitioning in the context of SOC test automation. It presents various techniques for the partitioning and optimization of the three major SOC test resources. Series: Frontiers in Electronic Testing. Num Pages: 244 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 15. Weight in Grams: 1170. . 2002. Hardback. . . . . Books ship from the US and Ireland.