Hardcover. Condizione: Good. Former owner's name on front endpaper.
EUR 3,99
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Très bon. Ancien livre de bibliothèque. Légères traces d'usure sur la couverture. Edition 1989. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Slight signs of wear on the cover. Edition 1989. Ammareal gives back up to 15% of this item's net price to charity organizations.
hardcover. Condizione: Very Good. Initials on bottom, otherwise clean and tight.
Condizione: New. Satisfaction Guaranteed or your money back.
EUR 174,95
Quantità: Più di 20 disponibili
Aggiungi al carrelloGebunden. Condizione: New. KlappentextA companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importan.
Lingua: Inglese
Editore: Artech House Publishers Apr 1989, 1989
ISBN 10: 0890063508 ISBN 13: 9780890063507
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 217,79
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi.
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
EUR 164,64
Quantità: Più di 20 disponibili
Aggiungi al carrelloHRD. Condizione: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Da: PBShop.store US, Wood Dale, IL, U.S.A.
EUR 176,45
Quantità: Più di 20 disponibili
Aggiungi al carrelloHRD. Condizione: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.