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Uncertainty Analysis for Nist Noise-Parameter Measurements (Classic Reprint)
Da: PBShop.store US, Wood Dale, IL, U.S.A.
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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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NoiseTemperature Measurement System for the Wr28 Band Classic Reprint
Da: PBShop.store US, Wood Dale, IL, U.S.A.
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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Recommended Terminology for Microwave Radiometry (Classic Reprint)
Da: PBShop.store US, Wood Dale, IL, U.S.A.
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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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A Lattice Approach to Volumes Irradiated by Unknown Sources (Classic Reprint)
Da: PBShop.store US, Wood Dale, IL, U.S.A.
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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Noise Temperature Measurements on Wafer (Classic Reprint)
Da: PBShop.store US, Wood Dale, IL, U.S.A.
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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Uncertainty Analysis for Nist Noise-Parameter Measurements (Classic Reprint)
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
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EUR 20,46
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Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Recommended Terminology for Microwave Radiometry (Classic Reprint)
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 20,46
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Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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NoiseTemperature Measurement System for the Wr28 Band Classic Reprint
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 20,46
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Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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A Lattice Approach to Volumes Irradiated by Unknown Sources (Classic Reprint)
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 20,86
EUR 3,77 shipping
Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Noise Temperature Measurements on Wafer (Classic Reprint)
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 20,86
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Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Uncertainty Analysis for Nist Noise-Parameter Measurements (Classic Reprint)
Da: PBShop.store US, Wood Dale, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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NoiseTemperature Measurement System for the Wr28 Band Classic Reprint
Da: PBShop.store US, Wood Dale, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Uncertainties in Nist Noise-Temperature Measurements (Classic Reprint)
Da: PBShop.store US, Wood Dale, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Noise Temperature Measurements on Wafer (Classic Reprint)
Da: PBShop.store US, Wood Dale, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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NoiseTemperature Measurement System for the Wr28 Band Classic Reprint
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
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EUR 26,26
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Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloHRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Uncertainty Analysis for Nist Noise-Parameter Measurements (Classic Reprint)
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 26,26
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Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloHRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Uncertainties in Nist Noise-Temperature Measurements (Classic Reprint)
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 26,49
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Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloHRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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Noise Temperature Measurements on Wafer (Classic Reprint)
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
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EUR 26,68
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Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloHRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
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INTUITIVE LIVING: A practical guide for women who want to deeply trust themselves (Intuitive & Inspired Series)
Libro 2 di 4: Intuitive & Inspired SeriesDa: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 17,50
EUR 13,75 shipping
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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Quantum Flavordynamics, Quantum Chromodynamics, and Unified Theories (NATO Science Series B:, 54)
Da: Midtown Scholar Bookstore, Harrisburg, PA, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Good. Torn/worn dj. Good hardcover with some shelfwear; may have previous owner's name inside. Oversized.
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Quantum Flavordynamics, Quantum Chromodynamics, and Unified Theories
Da: GreatBookPrices, Columbia, MD, U.S.A.
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Condizione: New.
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Quantum Flavordynamics, Quantum Chromodynamics, and Unified Theories (NATO Science Series B:)
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
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Condizione: New.
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Quantum Flavordynamics, Quantum Chromodynamics, and Unified Theories (NATO Science Series B:)
Da: California Books, Miami, FL, U.S.A.
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EUR 59,63
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Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Recommended Terminology for Microwave Radiometry (Classic Reprint)
Da: Forgotten Books, London, Regno Unito
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EUR 15,23
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Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Print on Demand. This book is a comprehensive guide to the essential terms, theories, and practices of microwave radiometry. The author compiles a list of recommended terminology and standards from different sources, creating a unified collection of knowledge in this interdisciplinary field. The book covers the general concepts of microwave radiometry, working principles and applications of real-aperture radiometers, and the intricacies of polarimetric radiometry. The author provides explicit mathematical definitions of terms and thorough explanations of concepts, making this book an invaluable reference for practicing engineers, scientists, and graduate students. The detailed treatment of advanced topics, such as interferometric radiometry, makes this book uniquely comprehensive and provides readers with a strong foundation to further explore this rapidly developing field. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
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Uncertainty Analysis for Nist Noise-Parameter Measurements (Classic Reprint)
Da: Forgotten Books, London, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 15,23
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Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Print on Demand. This book presents a detailed and practical guide to uncertainty analysis for noise parameter measurements of amplifiers and transistors, both in connectorized (coaxial) and on-wafer environments. The author covers theoretical frameworks, measurement methods, and uncertainty analysis for both types of environments. A Monte Carlo approach is used for type-B uncertainties. The text provides a comprehensive overview of the subject, including physical bounds and measurement techniques. The book is written in a clear and accessible style, making it suitable for a wide audience of engineers and researchers working in the fields of electrical engineering, microwave engineering, and noise characterization. The author's expertise in noise parameter measurements ensures the accuracy and depth of the content, making this book an invaluable resource for anyone seeking to understand and apply uncertainty analysis in their work. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
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Noise-Temperature Measurement System for the Wr-28 Band (Classic Reprint)
Da: Forgotten Books, London, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 15,23
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Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Print on Demand. This book presents an in-depth examination of noise-temperature measurement systems specifically designed for the WR-28 waveguide band. The book begins with a review of the underlying theory before delving into the design, testing, and operation of the system in detail. It is written with great clarity and includes numerous diagrams to illustrate the concepts discussed. The book also includes a comprehensive uncertainty analysis for the WR-28 system. The insights provided in this book are significant not only for the specific application of noise-temperature measurements in the WR-28 waveguide band but also for the broader field of noise metrology and precision measurement techniques. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
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Design and Testing of Nfrad, a New Noise Measurement System (Classic Reprint)
Da: Forgotten Books, London, Regno Unito
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EUR 15,28
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Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Print on Demand. This book reviews the theory, design, development, and testing of a new, automated, coaxial (GPG -7) radiometer for the measurement of noise sources in the 8 GHz to 12 GHz frequency band. It is an isolated, total -power radiometer that relies on lookup tables for relevant reflection coefficients and path asymmetry, resulting in much faster measurements compared to previous NIST systems. The author has added more ports to the switch head, increasing the number of devices under test that can be measured simultaneously, thus further increasing the speed of measurements. This book can also be used to assist in waveguide device measurements through adapters. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
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Quantum Flavordynamics, Quantum Chromodynamics, and Unified Theories
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: As New. Unread book in perfect condition.
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Uncertainties in Nist Noise-Temperature Measurements (Classic Reprint)
Da: Forgotten Books, London, Regno Unito
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EUR 15,46
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Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Print on Demand. This book is an in-depth examination of how uncertainties are measured and categorized in the NIST noise temperature measuring systems. It examines both the type A and type B uncertainties associated with these systems and provides a thorough overview of the methods used to quantify them. The author has consolidated information from various sources, some of which had not been previously published and reconciled any conflicting forms from the analysis. The book provides a clear picture of the uncertainties associated with NIST noise temperature measuring systems and their components, making it an essential resource for scientists and engineers working in this field. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
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Noise Temperature Measurements on Wafer (Classic Reprint)
Da: Forgotten Books, London, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 15,63
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Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Print on Demand. This book presents the theoretical foundations and experimental methods developed at the National Institute of Standards and Technology for performing accurate noise temperature measurements on a wafer. The primary focus is on extending existing techniques developed for traditional noise measurements in waveguides and coaxial structures to the more challenging case of measurements on a wafer. The text includes a thorough theoretical discussion of the basic equations for power, traveling waves, and noise temperature derivation. It also considers relevant issues such as mismatch factors, available power ratios, and the use of pseudo-waves. Several experimental configurations are described, along with the results of tests designed to confirm the developed theories and methods and to determine the accuracy of on-wafer noise temperature measurements. These techniques and methods are essential for the development of on-wafer noise figure measurements and for establishing traceability for on-wafer noise measurements, both of which are of great significance for miniaturization and integration of electronics. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
