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FINAL FLIGHT / AMBUSH AT OSIRAK
Da: The Book Abyss, St. Paul, MN, U.S.A.
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Mass Market Paperback. Condizione: Good. Please see any and all photos connected with this listing. A bit scuffed but all pages intact and legible. Good reading copies. Clean. Store Stamped. --- --- FINAL FLIGHT --- The most daring -- and deadly -- terrorist plot of all time is about to unfold aboard the supercarrier USS United States. If it succeeds, the balance of nuclear power will tilt in favor of a remorseless Arab leader. And it looks as if no one can stop it - except navy "jet jock" Jake Grafton. "Cag " Grafton is one helluva pilot. His F-14 Tomcat is one helluva plane. But some of Jake's crewmates have already vanished. A woman reporter who boarded the ship in Tangiers may not be who she claims to be. And Jake may have to disobey a direct order from the President himself for one spine-tingling, hair-raising Final Flight --- AMBUSH AT OSIRAK --- This military thriller centers on American counterspy David Llewelln's attempts to defuse an escalating Israeli/Iraqi conflict, save Iraq's Osirak atomic reactor from Israeli attack, and prevent a major international war. . .
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The Field Is the World: A History of the Canton Mission (1929?1949) of the Churches of Christ
Da: Lakeside Books, Benton Harbor, MI, U.S.A.
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The Field Is the World: A History of the Canton Mission (1929-1949) of the Churches of Christ
Da: Windows Booksellers, Eugene, OR, U.S.A.
Membro dell'associazione: CBA IOBA
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Paperback. New book. 152 pp.
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CliffsNotes CSET Multiple Subjects: Fourth Edition, Revised (CliffsNotes Test Prep)
Da: GoPeachy, JACKSONVILLE, FL, U.S.A.
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paperback. Condizione: Good. Ships from FL, USA with Tracking. Inspected, Complete and Guaranteed. Wear to cover and edge wear; May have writing or highlighting; No missing or torn pages; Binding solid. 30-Day Satisfaction Guarantee.
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The Field Is the World
Da: Lakeside Books, Benton Harbor, MI, U.S.A.
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Aggiungi al carrelloCondizione: New. Brand New! Not Overstocks or Low Quality Book Club Editions! Direct From the Publisher! We're not a giant, faceless warehouse organization! We're a small town bookstore that loves books and loves it's customers! Buy from Lakeside Books!
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The Field Is the World: A History of the Canton Mission (1929-1949) of the Churches of Christ
Da: Revaluation Books, Exeter, Regno Unito
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The Field Is the World: A History of the Canton Mission (1929-1949) of the Churches of Christ
Da: Ria Christie Collections, Uxbridge, Regno Unito
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The Field Is the World
Da: Chiron Media, Wallingford, Regno Unito
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CliffsNotes CSET Multiple Subjects: Fourth Edition, Revised (CliffsNotes Test Prep)
Da: California Books, Miami, FL, U.S.A.
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The Field Is the World: A History of the Canton Mission (1929-1949) of the Churches of Christ
Da: Ria Christie Collections, Uxbridge, Regno Unito
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The Field Is the World: A History of the Canton Mission 19291949 of the Churches of Christ
Da: Revaluation Books, Exeter, Regno Unito
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Aggiungi al carrelloHardcover. Condizione: Brand New. 156 pages. 5.50x0.44x8.50 inches. In Stock.
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Introduction to Statistics in Metrology
Da: Books From California, Simi Valley, CA, U.S.A.
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hardcover. Condizione: Very Good.
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Introduction to Statistics in Metrology
Da: GreatBookPrices, Columbia, MD, U.S.A.
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EUR 103,92
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Introduction to Statistics in Metrology (Hardcover)
Lingua: Inglese
Editore: Springer Nature Switzerland AG, Cham, 2020
ISBN 10: 303053328X ISBN 13: 9783030533281
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: new. Hardcover. This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Introduction to Statistics in Metrology
Da: GreatBookPrices, Columbia, MD, U.S.A.
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EUR 121,22
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The Field Is the World
Da: PBShop.store US, Wood Dale, IL, U.S.A.
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Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Introduction to Statistics in Metrology
Da: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 122,91
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Introduction to Statistics in Metrology
Da: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 122,93
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Introduction to Statistics in Metrology
Da: GreatBookPricesUK, Woodford Green, Regno Unito
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Introduction to Statistics in Metrology
Da: California Books, Miami, FL, U.S.A.
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EUR 145,57
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Introduction to Statistics in Metrology
Da: California Books, Miami, FL, U.S.A.
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EUR 145,57
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Introduction to Statistics in Metrology
Da: GreatBookPricesUK, Woodford Green, Regno Unito
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EUR 139,83
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EUR 123,00
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Introduction to Statistics in Metrology | Stephen Crowder (u. a.) | Taschenbuch | xxi | Englisch | 2021 | Springer | EAN 9783030533311 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Introduction to Statistics in Metrology
Lingua: Inglese
Editore: Springer International Publishing, Springer Nature Switzerland, 2021
ISBN 10: 303053331X ISBN 13: 9783030533311
EUR 139,09
Spedizione EUR 62,82
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.
-
Introduction to Statistics in Metrology
Lingua: Inglese
Editore: Springer International Publishing, Springer Nature Switzerland, 2020
ISBN 10: 303053328X ISBN 13: 9783030533281
EUR 139,09
Spedizione EUR 63,62
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.
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Introduction to Statistics in Metrology
Lingua: Inglese
Editore: Springer International Publishing, Springer Nature Switzerland Dez 2021, 2021
ISBN 10: 303053331X ISBN 13: 9783030533311
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
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EUR 139,09
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware -This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts.The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 372 pp. Englisch.
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Introduction to Statistics in Metrology
Lingua: Inglese
Editore: Springer International Publishing, Springer International Publishing Dez 2020, 2020
ISBN 10: 303053328X ISBN 13: 9783030533281
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
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EUR 139,09
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Aggiungi al carrelloBuch. Condizione: Neu. Neuware -This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts.The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 372 pp. Englisch.
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Introduction to Statistics in Metrology
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 191,93
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Aggiungi al carrelloHardcover. Condizione: Brand New. 368 pages. 9.25x6.10x0.91 inches. In Stock.
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Introduction to Statistics in Metrology (Hardcover)
Lingua: Inglese
Editore: Springer Nature Switzerland AG, Cham, 2020
ISBN 10: 303053328X ISBN 13: 9783030533281
Da: AussieBookSeller, Truganina, VIC, Australia
Valutazione del venditore 5 su 5 stelle
EUR 191,02
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Aggiungi al carrelloHardcover. Condizione: new. Hardcover. This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Introduction to Statistics in Metrology
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 205,63
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Aggiungi al carrelloHardcover. Condizione: New. New. book.
