Sunil khatri (146 risultati)

hardcover. Condizione: Very Good. No Dust Jacket. Name from previous owner on FEP. No dust jacket. Staining on front cover as though from light spattered paint. Binding otherwise very well preserved, pages are clean and crisp, and printing is tight, clean and bright throughout. MB. Used.

N.A. Condizione: New. ISBN:9789384588571.

Hardcover. Condizione: New. 1st Edition. Contents: 1. Technology Management Through Intellectual Property Rights. 2. Two Practical Software Reliability Growth Models for Software Project Management. 3. Management of Technology and Innovation for Nation Building. 4. Even, Inventors Require Help. 5. Quality Beyond "Product and Service" Delivery. 6. Vulnerability Discovery Modeling. 7. Chance Constrained Redundancy Allocation Problem with Imprecise Component Reliabilities via Genetic Algorithm: A Simulation Based Approach. 8. Life Estimation of Electronic Sub-assembly by MultipleAccelerated Life Tests. 9. Technology Management in Segmented Markets. 10. Partition Algorithm for Frequent Pattern Mining Using TwoColumns Atomic Data Layout. 11. A Production Model with Variable Holding Cost, Backloggingand In?ation Under Fuzzy Environment. 12. Location Based Authentication Using Node's Coordinates. 13. Uni?cation Schemes in Software Reliability: A State of Art. 14. Life Estimation of Electronic Sub-assembly by Multiple Accelerated Life Tests. 15. Simultaneous Consideration of Time & Price for Adoption of Consumer Durables. 16. Green Six Sigma for Sustainable Business Practices. 17. Introducing Path Selection Algorithm in Reliability Analysis of Component Based Software System . 18. A Study of S-shaped Software Reliability Growth Modeling with Testing Effort. 19. Bass Model Incorporating Change in the Adoption Rate: A Study in Discrete Environment. 20. Reliability Estimation of Shutdown System Considering Common Cause Failures. 21. Retailer's Optimal Ordering Policies for Deterioration Items Under Trade Credit Policy in a Supply Chain System. 22. Genetic Algorithm Based Approach For Unbalanced Assignment Problem. 23. Managing Launch Time of Successive Industrial Technologies. 24. Dissimilarity Measures for Re?nement of Clusters Based on Page Access, Time and Session Weight. 25. Multi Criteria Based Launch of a New Product. 26. Design Optimization of Post-core Restored Endodontically Treated Human Teeth Using Finite Element Method and Taguchi Methods. 27. Testing-Domain Based SRGM for Distributed Environment Incorporating Two Types of Imperfect Debugging. This book is intended to serve as a textbook of applied physics/Physics paper of the undergraduate students of B.E., B.Tech and Application of computer software has crossed into many different fields, with software being an essential part of industrial, commercial and military systems. Because of its many applications in safety critical systems, software reliability is now an important research area. Software vulnerability can be seen as a flaw or weakness in the system that can be exploited by an attacker in order to alter the normal behavior of the system. Vulnerability management is the cyclical practice of identifying, classifying, remediating, and mitigating vulnerabilities. Industrial Technology Management is the use of engineering and manufacturing technology to make production faster, simpler and more efficient. The industrial technology field employs creative and technically proficient individuals who can help a company achieve efficient and profitable productivity. Papers in this book are classified into six main areas, namely, Software Reliability, Quality, Vulnerability, Optimization, Technology Management and Innovation. (jackets). …

gebundene Ausgabe. Condizione: Gut. 192 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 480.…

Condizione: New.

Condizione: New. pp. x + 156.

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Condizione: New. pp. x + 156 Figures.

Condizione: New. pp. x + 156.

Condizione: New.

Paperback. Condizione: Brand New. 350 pages. 6.14x0.78x9.21 inches. In Stock.

Condizione: New.

Condizione: New. In English.

Condizione: New. In English.

Condizione: New. In English.

Condizione: New. In English.

Condizione: New. Ajay Kumar Vyas is an Associate Professor &amp Head of Department, at the Department of Information and Communication Technology, Adani University, Ahmedabad, India. He is a fellow member of IETE, a senior member of IEEE, a life member of ISTE, a.

Condizione: New.

Condizione: New.

Condizione: New.

Condizione: New. In English.

Condizione: New. pp. 124.

Condizione: New. Cross-talk is one of the major problems since it results in unpredictable design behavior. It can result in delay variation or signal integrity problems in a wire, depending on the state of its neighboring wire. This book introduces a framework for cross-talk-free IC design. It uses a predetermined layout pattern on the IC. Num Pages: 112 pages, biography. BIC Classification: TJF; UY. Category: (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 9. Weight in Grams: 830. . 2001. Hardback. . . . .…

Condizione: New. pp. 140.

Condizione: New. pp. 160.

Condizione: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Condizione: New. pp. 216.

hardcover. Condizione: Good. Hardcover ex-library with typical marks shows moderate cover wear. Text is unmarked. Ships FAST.

Paperback. Condizione: Brand New. reprint edition. 156 pages. 9.25x6.10x0.38 inches. In Stock.