Editore: Foreign Language Press, Beijing, 1989
Prima edizione
Trade Paperback. Condizione: Very Good. Yaoyi, Shen (illustratore). First Edition. BW2 - Book has light rubbing, crease on the gutters, lightly bumped on some corners, discoloration (browning), and light shelf wear otherwise very good. Stated First Edition 1989. Size: 8vo - over 7¾" - 9¾" tall.
Lingua: Inglese
Editore: Foreign Languages Press, Beijing, China, 1989
ISBN 10: 0835122638 ISBN 13: 9780835122634
Da: Goulds Book Arcade, Sydney, Newtown, Sydney, NSW, Australia
EUR 22,25
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Very Good. Shen Yaoyi (illustratore). 382 pages. The cover has a little wear. The page edges are lightly tanned. Books listed here are not stored at the shop. Please contact us if you want to pick up a book from Newtown.
Da: Buchpark, Trebbin, Germania
EUR 77,07
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
Condizione: New. 1st ed. 2022 edition NO-PA16APR2015-KAP.
Da: Books Puddle, New York, NY, U.S.A.
Condizione: New.
Da: Revaluation Books, Exeter, Regno Unito
EUR 232,25
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 188 pages. 9.25x6.10x0.63 inches. In Stock.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 258,74
Quantità: 1 disponibili
Aggiungi al carrellopaperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Editore: China, 1974
Da: AntikBar Original Vintage Posters, London, UK, Regno Unito
Arte / Stampa / Poster
EUR 298,08
Quantità: 1 disponibili
Aggiungi al carrelloChen Yaoyi (illustratore). Original vintage Chinese Communist propaganda poster - Learn from Lu Xun's revolutionary spirit and become a pioneer in criticising Lin Biao and Confucius / å¦ä é è¿çé å'½ç ¾ç¥ 使 ææ å"çé å° - featuring an illustration of a lady holding a book next to a worker with goggles on his head and a soldier in uniform holding papers titled Excerpts from Lu Xun's Criticism of Confucius and Mencius with an image of the Chinese writer, literary critic, lecturer and state servant Lu Xun (1881-1936) on the orange background, the text in red below. The political and intellectual Criticise Lin Biao, Criticise Confucius Campaign (1973-1976) started by the founder of the People's Republic of China PRC Mao Zedong (1893-1976) and the leader of the Gang of Four (1965/6-1976), Mao's fourth wife, the actress and Communist revolutionary Jiang Qing (1914-1991), was an academic attempt to interpret Chinese history; it ended with the arrest of Mao Zedong, his wife, and three other Chinese Communist Party CCP officials Zhang Chunqiao, Yao Wenyuan and Wang Hongwen. Horizontal. Fair condition, folds, tears, creasing, paper losses on edges, staining, large restored tear through image. Size: 77x106cm.
Lingua: Inglese
Editore: Springer, Berlin|Springer Nature Singapore|Springer, 2023
ISBN 10: 9811931348 ISBN 13: 9789811931345
Da: moluna, Greven, Germania
EUR 136,16
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimenta.
Lingua: Inglese
Editore: Springer, Berlin|Springer Nature Singapore|Springer, 2022
ISBN 10: 9811931313 ISBN 13: 9789811931314
Da: moluna, Greven, Germania
EUR 136,16
Quantità: Più di 20 disponibili
Aggiungi al carrelloGebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimenta.
Da: Majestic Books, Hounslow, Regno Unito
EUR 200,46
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand.
Da: Majestic Books, Hounslow, Regno Unito
EUR 201,78
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 219,37
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 220,77
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND.