Springer edition fourth edition 2018 (1 risultati)
Casa editrice:
Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
- Rilegato
Da: BooksRun, Philadelphia, PA, U.S.A.BooksRun
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Discreto
EUR 55,35
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Fair. Fourth Edition 2018. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.
