ISBN: 9780123944221 - neutron and x-ray microscopy: part a: volume 172 (2 risultati)
Lingua: Inglese
Editore: Elsevier Science & Technology, Academic Press, 2012
Serie: Libro 47 di 77 - ISSN
- Rilegato
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 185,00
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Englisch.…
Lingua: Inglese
Editore: Elsevier Science & Technology, Academic Press, 2012
Serie: Libro 47 di 77 - ISSN
- Rilegato
- Print on Demand
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 220,58
EUR 44,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.…
